Test Access Port (n)~ A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins TCK/clock TMS/mode select TDI/data in TDO/data out and TRST/reset.
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Test Access Port (n)~ A collection of boundary scan control signals that define a serial protocol for scan-based devices. There are five pins TCK/clock TMS/mode select TDI/data in TDO/data out and TRST/reset.
